Domestic memory first! ChangXin DDR5 welcomes new product

Jiahe Jinwei's sub-brand SINKER has officially launched a DDR5 RDIMM 48GB 5600MT/s server memory module featuring domestic ChangXin memory chips, marking the first known 48GB non-binary capacity server memory using domestic chips.

Since May 2026, SINKER server memory modules have fully adopted ChangXin DDR5 chips, rolling out DDR5-5600 RDIMM products in 64GB, 32GB, and 16GB capacities, all running at 5600MT/s.

The newly added 48GB specification uses domestically produced DRAM wafers for in-house packaging. From the wafer warehousing stage, each chip undergoes electrical parameter scanning, leakage characteristic testing, impedance consistency verification, and process defect screening, keeping single-chip electrical parameter deviations within extremely tight industry-allowed thresholds.

This memory adopts a 2Rank×8 (2R8) standard DRAM bit-width layout, designed for high-density server expansion scenarios. With optimized electrical loading, single-socket or dual-socket servers can achieve TB-level total memory capacity deployment, providing ample physical space for memory-intensive workloads such as virtual machine clusters, in-memory databases, and AI large model loading.

Running at 5600MT/s, equivalent to PC5-44800, a single module delivers bandwidth exceeding 44.8GB/s—doubling the bandwidth of DDR4 architecture—significantly improving processing efficiency for data-intensive tasks like AI model training and big data analytics.

Standard 1.1V low-voltage power supply, paired with an onboard PMIC power management chip for intelligent voltage regulation and power control, balances high performance with energy efficiency, helping data centers reduce PUE values.

The memory also features a dual error-correction architecture combining On-die ECC and External ECC, capable of automatically detecting and correcting single-bit and even multi-bit data errors. In dedicated validation testing, artificially simulated single/multi-bit data error scenarios confirmed the effectiveness of the dual ECC architecture's detection, correction, and alert functions.

Official environmental testing included 45°C to 85°C wide-temperature 7×24-hour full-load burn-in, combined with thermal cycling and humidity resistance tests to simulate extreme data center conditions. Power supply testing involved voltage margin verification, confirming stable operation within ±5% voltage fluctuation ranges, ensuring no reboots, no crashes, and no performance degradation.